Field emission scanning electron microscope

Description:
Gemini 500 FE-SEM provides surface-sensitive, distortion-free, high resolution imaging. This instrument is also coupled with Energy Dispersive X-rays spectrometer (EDX) for elemental characterization. This system is equipped with a LaB6 field emitting electron gun and three types of detectors, viz., InLens, SE2 and ESB detectors. Samples are mounted firmly on the SS-stub using C-tape. Gold coating facility is available for imaging the insulating materials. This instrument can operate with acceleration of 0.2 to 30 kV. Sample must be non-hygroscopic.

Applications:

1. Morphology analysis of crystalline materials as well as bacterial surfaces, macromolecules, virus etc.
2. Characterization of thin film surfaces and nanoparticles imaging.
3. Investigate the interactions between membranes and macromolecules at the molecular scale.
4. Offers insights into a variety of phenomena on separation and fouling in membrane processing.

Software used:

1. SmartSEm User Interface for the surface imaging
2. Apex for elemental composition analysis