Description:
Bruker D8 ADVANCE ECO P-XRD system is equipped with Cu-Kα X-ray source, Ni-filter for low Cu-Kß radiation and LYNEXYE detector. Featuring a high-brilliance 1 kW line focus X-ray source, this system consumes very low energy and does not require any external water cooling. The LYNXEYE detector (SSD XE) facilitates high-speed data acquisition, excellent angular resolution and outstanding peak-to-background ratio. It is used to record diffraction patterns from a powder as well as thin film and polymer samples.
1. Phase identification, quantitative phase analysis microstructure analysis.
2. Structure determination and refinement.
3. Residual stress and texture.
4. Provides the nature, size and strain broadening of the crystallites.
5. Identification and characterization of polymorph, monitoring the stability, development and validation of drugs in pharmaceutical industries
1. DIFFRAC.EVA for visualization, data reduction, phase identification and quantification, statistical evaluation.
2. DIFFRAC.TOPAS for Bragg and PDF refinements: From single line fitting to crystal structure analysis.