Atomic Force Microscope, Make: OxfordInstruments, Model: Cypher S

Working Principle:

Atomic Force Microscope (AFM)

Make: Oxford
Model : Cypher

Working Principle: AFMs operate by measuring force between a probe and the sample .To acquire the image resolution, AFMs can generally measure the vertical and lateral deflections of the cantilever by using the optical lever. The optical lever operates by reflecting a laser beam off the cantilever. The reflected laser beam strikes a position-sensitive photo-detector consisting of four-segment photo-detector. The differences between the segments of photo-detector of signals indicate the position of the laser spot on the detector and thus the angular deflections of the cantilever.

Applications: Used in material as well as biological sciences for topographical imagery.

Location: CIF-105-A
Instrument In-Charge :- Mr. Madhurjya Borah
 

Instrument In-Charge- M. Borah
In-charge Email Id :- m.borah@iitg.ac.in
Instrument Co- InCharge- R. R. Pao
Office Contact Number: 03612583119

Instrument Status: Working