Spectroscopic Ellipsometer Make: SEMILAB, Model: GES5E

Working Principle:

Make: SEMILAB, Model: GES5E

Working Principle: A variable angle spectroscopic ellipsometry is used to estimate the nm order thickness and optical constant of thin film very precisely at room temperature, low temperature (cryostat) and high temperature (linkam) state. Ellipsometry is an optical technique devoted to the analysis of surfaces. It is based on the measurement of the variation of the polarization state of the light after reflection on a plane surface.

Application: This is mainly used for measurement of Thickness, Optical properties, Composition of material, Surface roughness, Crystallinity.

Location: CIF-106-A
Operating Hour:9 am to 5 pm (Daily)

Instrument In-Charge- A. Malakar
In-charge Email Id :- ashimmalakar@iitg.ac.in
Instrument Co- InCharge- C.Borgohain
Office Contact Number: 03612583107

Instrument Status: Not Working