ELECTRICAL CHARACTERIZATION

Instrument Name
Instrument Image
Status
Faculty In-charge
Staff In-charge

DC Probe Station

Model: CPX100

This equipment is used for four probe temperature controlled DC characterization equipment for measurement of IV characteristics of semiconductor devices.

----- Prof. Parameswar Krishnan Iyer Mr. Anand Swarup S

Cryogenic Probe station

Model:

A Cryogenic Probe Station is used to characterize electronic devices at extremely low temperatures, typically down to a few Kelvin. It allows for electrical measurements on semiconductor devices such as superconducting devices and high electron mobility transistors, enabling research and development in areas such as quantum devices and low-temperature electronics.

----- Mr. Sandhan Sarma

Pulsed Laser Deposition

Model: Excel Instrument

It is a thin film deposition technique used to grow high-quality thin films of various materials onto substrates. PLD is widely used in research and industry for the deposition of complex oxide materials, superconductors, ferroelectrics, and other thin film structures.

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