The Rigaku TTRAX III is the most widely used diffractometer all over the world. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly from its 18 kW rotating anode X-ray source.

Maximum Output: 2J/Pulse, Pulse Duration: 6 ns. Used in: (i) Thin Film Deposition via Pulsed Laser Deposition (ii) Nanoparticle synthesis by Pulsed Laser Ablation in Liquid (iii) Laser micro—machining (iv) Laser Induced Breakdown spectroscopy.

Vacuum chamber for pulsed laser deposition (PLD) of thin films of various material including composites of oxides, sulphides and metallic thin films in various gas ambient. The chamber is also used in study of laser induced plasma using Laser induced breakdown spectroscopy (LIBS) and electrical probes.

High speed, gated CCD camera. Used in the study of: (i) Laser produced plasma plume dynamics (ii) Laser induced cavitation bubbles in liquid (iii) Nonlinear properties using Z-scan technique

Magneto-resistance (MR) is used to measure the electrical transport behaviour of a semiconductor in an external magnetic field. MR setup is assembled with Keithley multi-meters, the electromagnetic coils (~1T).

Vacuum Techniques Pvt. Ltd. make thin-film deposition system in sputter-up configuration, equipped with four RF/DC magnetron guns of size 2 inch with the capability of adjustable substrate to target distance.

The MicroMaxâ„¢ 007 HF is the most widely used home lab X-ray source for protein crystallography and a popular source for small molecule crystallographers who need the additional flux of a rotating anode generator.

Multichamber rf-PECVD and HWCVD (Excel Instruments) thin film deposition technique has three rf-PECVD (13.6 MHz) chambers for different layers and one HWCVD chamber.

Lake Shore 7410 VSM system is one of the most sensitive electromagnet-based VSM commercially available used to characterize the DC magnetic properties of materials as a function of magnetic field, temperature, and time.

Veeco (Dektak 150) used for thickness and roughness of thin films. It has scan length of 55mm to 200mm, maximum thickness range (vertical) of 1mm, vertical resolution of 1 Å.

Perkin Elmer (Lambda 950) used for absorption, reflection and transmission of thin film and power samples. It has 2D detector module, Universal Reflectance Accessory, Integrating sphere and wavelength range of 200-3300 nm.

The Ferroelectric Tester (M/s Radiant Technologies, Precision LCII 10kV HVI-SC) is mostly used in ferroelectric materials to measure the ferroelectric (P-E loops) and piezoelectric properties.

Perkin Elmer (BX) FTIR technique used composition analysis of thin films and powder samples in the range of 400-4000 cm-1.

Olympus (BX51M) has magnification of 5-100X, resolution of 0.37µm, depth of focus is 0.73µm and length of µm to 10mm.