Syllabus (Elective): M.Tech

Optical measurement techniques and applications

Code: EE 646 | L-T-P-C : 3-0-0

Fundamentals of Optics: Complex representation of waves, Scalar diffraction theory, Fresnel and Fraunhofer diffraction, Frequency analysis of optical imaging systems, Optical transfer function; Light Sources and detectors: Sources of light, Fundamentals and applications of lasers, Types of laser sources, Photodetectors, CCD and CMOS image sensors, Spatial light modulator; Interferometric Optical measurement techniques and applications: Fundamentals of interferometry, Type of interferometry setups, Digital Holography, Holographic interferometry, Electronic speckle pattern interferometry, Moiré interferometry, Photoelasticity, Fringe projection profilometry; Optical coherence Tomography, Applications; Interferometric Optical measurement techniques – Data analysis: Phase shifting interferometry: Synchronous and Asynchronous, Fourier transform interferometry; Spatial and temporal fringe analysis: Single or multiple phase estimation, Single or multiple phase derivative estimation, Exponential phase signal analysis, Closed fringe analysis, Fringe denoising algorithms, Phase quality maps, Phase unwrapping algorithms, Multicomponent optical signal separation algorithms; Non-Interferometric Optical measurement techniques, analysis and applications: Digital image correlation, Brief discussion on Microscopy and Spectroscopy, Applications.

Texts/ References:

1. J. Goodman, Introduction to Fourier Optics, W. H. Freeman, 2017.
2. T. Yoshikawa, Handbook of Optical Metrology: Principles and Applications, CRC press, 2017.
3. R. Sirohi, Introduction to Optical Metrology, CRC press, 2015.
4. M. Servin, J.A. Quiroga and M. Padilla, Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications, Wiley WCH, 2014.